SOC test planning using virtual test access architectures
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: IEEE Transactions on Very Large Scale Integration (VLSI) Systems
سال: 2004
ISSN: 1063-8210,1557-9999
DOI: 10.1109/tvlsi.2004.834228